Stress Birefringence/Phase Difference Measuring Instrument WPA-NIR
Contact Info
- Add:北京市海淀區(qū)北清路68號用友產(chǎn)業(yè)園西區(qū)1號樓, Zip: 100094
- Contact: 魯經(jīng)理，王經(jīng)理
- Tel:010-69698892
- Email:sales@oelectron.com
Other Products
Materials such as chalcogenide and infrared resins are opaque to visible light, making residual stress evaluation of such samples extremely challenging. To address this, Photonic Lattice has specifically developed the WPA-NIR birefringence measurement instrument, which utilizes wavelengths of 850nm or 940nm to enable high-speed measurement and analysis of birefringence/residual stress distribution in near-infrared materials. Equipped with the user-friendly and practical software WPA-View, it allows for free analysis of quantitative data such as phase difference distribution patterns along any line and average values within any region.It can be paired with the corresponding 'External Control Option' for production lines and is also applicable in mass production environments.
Main Features:
- Birefringence at infrared wavelengths/phase difference surface distribution measurement
- Optical distortion evaluation of chalcogenide, infrared transparent resins, etc.
- Compact size, easy operation, high-speed measurement
- WPA-NIR enables high-speed measurement/analysis of birefringence distribution at wavelengths of850nmor940nm birefringence distribution
- Equipped with the user-friendly and practical softwareWPA-View
- Free analysis of quantitative data such as phase difference distribution patterns along any line and average values within any region
- Can be paired with the corresponding 'External Control Option' for production lines and is also applicable in mass production environments
- High-speed measurement of surface birefringence/phase difference distribution
- NIR wavelength enables acquisition of high-density birefringence/phase difference information within seconds using only mouse operations
- Simple and quick saving/loading of measurement data
- All measurement results can be saved/loaded, facilitating comparison with past measurement results, etc.
- Rich graph creation functionality
- Free creation of line graphs and histograms
- Measurement results can be compared on a single graph or exported inCSVformat
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| Origin: | China / Beijing / Haidianqu |
